Bend or flexure testing provides a convenient method for characterising the strength of the miniature components and specimens that are typical of those found in microelectronics applications.
Fixtures are available for both three and four point loading.
Principle of Operation
The specimen is supported on two lower anvils set at a defined distance. The support span can be adjusted according to the specimen size. Force is applied to the specimen by an upper anvil located at the mid-span of the lower anvils. Some fixtures feature an option for four-point loading.